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The International Conference on Informatics and Systems (INFOS)

作者： M. E. Madkour S. E. Soliman P. K. Varshney M. I. Moawad F. E. Abd El-Samie Nuclear fuel technology Department Hot Laboratories Center Atomic Energy Authority Cairo Egypt Electrical Engenering and Computer Science Department Syracuse NY USA Electronics and Electrical Communications Department Faculty of Electronic Engineering Menoufia University Menouf Egypt

The transmission of data over Wireless Sensor Networks (WSNs) poses significant constraints on the energy and bandwidth of the communication system. We consider the problem of decision fusion in a distributed detection system in a classical parallel fusion structure by incorporating the fading channel layer that is omnipresent in wireless sensor networks. We use channel coding and transmit diversity schemes, Equal Gain Combining (EGC) and Maximum Ratio Combining (MRC). We employ a multi-carrier modulation scheme over the wireless communication channel. This paper proposes the use of Hamming, Low-Density Parity-Check (LDPC) Coding, or Viterbi coding. Interleaving is also suggested in this paper using chaotic Baker map randomization for the reduction of the Bit Error Rate (BER). Moreover, the chaotic interleaving adds a degree of security to the transmitted data. Simulation results show that the application of coding and interleaving achieves a performance improvement in the wireless sensor network.

关键词： Encoding Sensors Wireless sensor networks Viterbi algorithm Bit error rate Fading Parity check codes

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Initial-condition estimation in network synchronization processes: Algebraic and graphical characterizations of the estimator

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Complex Systems 2012年第4期21卷 297-333页

作者： Xue, Mengran Yeung, Enoch Rai, Anurag Roy, Sandip Wan, Yan Warnick, Sean Department of Electrical Engineering and Computer Science University of Michigan Ann Arbor MI United States Department of Computing and Mathematical Sciences California Institute of Technology Pasadena CA United States Department of Electrical Engineering Massachusetts Institute of Technology Cambridge MA United States Department of Electrical Engineering Washington State University Pullman WA United States Department of Electrical Engineering University of North Texas Denton TX United States Information and Decision Algorithms Laboratories Brigham Young University Provo UT United States

A graph-theoretic analysis of state inference for a class of network synchronization (or diffusive) processes is pursued. Precisely, estimation is studied for a nonrandom initial condition of a canonical synchronization dynamic defined on a graph, from noisy observations at a single network node. By characterizing the maximum-likelihood estimation of the initial condition and the associated Cramer-Rao bound, graph properties are identified (e.g., symmetries, interconnection strengths, spectral measures) that determine (1) whether or not estimation is possible and (2) the quality of the estimate. © 2013 Complex Systems Publications, Inc.

关键词： Maximum likelihood estimation

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Development of Nanostructured Antireflection Coatings for EO/IR Sensor and Solar Cell Applications

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Materials sciences and Applications 2012年第9期3卷 633-639页

作者： Ashok K. Sood Adam W. Sood Roger E. Welser Gopal G. Pethuraja Yash R. Puri Xing Yan David J. Poxson Jaehee Cho E. Fred Schubert Nibir K. Dhar Dennis L. Polla Pradeep Haldar Jennifer L. Harvey College of Nanoscale Science and Engineering Albany USA Department of Electrical and Computer Systems Engineering and Physics Rensselaer Polytechnic Institute Troy USA Magnolia Solar Inc. Albany USA Microsystems Technology Office of the Defense Advanced Research Projects Agency Arlington USA New York State Energy Research and Development Authority Albany USA.

Electro-optical/infrared (EO/IR) sensors and photovoltaic power sources are being developed for a variety of defense and commercial applications. One of the critical technologies that will enhance both EO/IR sensor and photovoltaic module performance is the development of high quality nanostructure-based antireflection coatings. In this paper, we review our work on advanced antireflection structures that have been designed by using a genetic algorithm and fabricated by using oblique angle deposition. The antireflection coatings are designed for the wavelength range of 250 nm to 2500 nm and an incidence angle between 00 and 400. These nanostructured antireflection coatings are shown to enhance the optical transmission through transparent windows over a wide band of interest and minimize broadband reflection losses to less than one percent, a substantial improvement over conventional thin-film antireflection coating technologies.

关键词： Antireflection Coating Nanostructured Layer Oblique Angle Deposition Silicon Dioxide Broadband Omni-Directional

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The best material for the function: Seamless on-wafer integration of GaN and Si devices

The best material for the function: Seamless on-wafer integr...

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2011 International Conference on Compound Semiconductor Manufacturing technology, CS MANTECH 2011

作者： Lee, Hyung-Seok Ryu, Kevin Chung, Jinwook Palacios, Tomás Department of Electrical Engineering and Computer Science Microsystems Technology Laboratories Massachusetts Institute of Technology 77 Massachusetts Ave. Cambridge MA 02139 United States

ISBN: (纸本)1893580172

The recent demonstration of the seamless on-wafer integration of GaN electronics and CMOS Si devices enables the combination of the excellent high voltage and high frequency properties of GaN transistors with the unsurpassed circuit complexity and scaling of Si technology. This paper describes our recent results to expand this heterogeneous integration from the initial 1x1 cm2 demonstration to full 4" wafers that integrate hybrid power, mixed signal and digital circuits.

关键词： III-V semiconductors

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Physical Characterization of Microelectronic Polymeric Thin Films

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MRS Online Proceedings Library 2011年第1期227卷 167-176页

作者： Stephen D. Senturia Susan C. Noe Jeffrey Y. Pan Microsystems Technology Laboratories Department of Electrical Engineering and Computer Science Cambridge USA

The measurement of the mechanical properties and adhesion of polymeric thin films and coatings poses a number of technical problems. Elastic and viscoelastic properties, residual stress, adhesion, the effects of extended cure, and the effects of adsorbed moisture and process reagents are all critical. A particular challenge is to develop measurement methods which can be used with actual samples, preferably non-destructively. This paper examines a number of methods which have been developed to make these measurements, with emphasis on methods which are sensitive enough to look at the effects of process variation and the effects of moisture exposure. Suspended-membrane methods for measuring elastic and viscoelastic properties, residual stress, and adhesion are combined with optical methods for determining index of refraction and birefringence to yield a family of techniques for performing physical characterization. Recent results on the effects of extended cure and moisture uptake on elastic properties, residual stress, and optical properties will be presented.

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Publisher's Note: “Phase locking of a 3.4 THz third-order distributed feedback quantum cascade laser using a room-temperature superlattice harmonic mixer” [Appl. Phys. Lett. 103, 051115 (2013)]

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Applied Physics Letters 2013年第10期103卷

作者： D. J. Hayton A. Khudchenko D. G. Pavelyev J. N. Hovenier A. Baryshev J. R. Gao T. Y. Kao Q. Hu J. L. Reno V. Vaks SRON Netherlands Institute for Space Research 9474 AD Groningen The Netherlands Lobachevskii State University of Nizhny Novgorod Nizhny Novgorod 603950 Russia Kavli Institute of Nanoscience Delft University of Technology Lorentzweg 1 2628 CJ Delft The Netherlands Research Laboratory of Electronics Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology MIT Cambridge Massachusetts 02139 USA CINT Sandia National Laboratories Albuquerque New Mexico 87185-0601 USA Institute for Physics of Microstructures Russian Academy of Sciences Nizhny Novgorod 603950 Russia

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Nanotube Arrays: Joining Copper Oxide Nanotube Arrays Driven by the Nanoscale Kirkendall Effect (Small 15/2013)

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Small 2013年第15期9卷

作者： Shu Rong Chun Wardhana Aji Sasangka Mei Zhen Ng Qing Liu Anyan Du Jie Zhu Chee Mang Ng Zhi Qiang Liu Sing Yang Chiam Chee Lip Gan School of Materials Science and Engineering Nanyang Technological University Block N4.1 50 Nanyang Avenue Singapore 639798 Singapore GLOBALFOUNDRIES Singapore Pte Ltd 60 Woodlands Industrial Park D Street 2 Singapore 738406 Singapore Advanced Materials for Micro- and Nano-Systems Singapore-MIT Alliance 4 Engineering Drive 3 Singapore 117576 Singapore Temasek Laboratories Nanyang Technological University Block N4.1 50 Nanyang Avenue Singapore 639798 Singapore Department of Electrical and Computer Engineering National University of Singapore 4 Engineering Drive 3 Singapore 117576 Singapore Institute of Materials Research and Engineering A*STAR (Agency for Science Technology and Research) 3 Research Link Singapore 117602 Singapore

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Characterization of the Piezoelectric Response of Aluminum Nitride Grown by dc Magnetron Sputtering for Applications in Thin-Film Resonators

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MRS Online Proceedings Library 2011年第1期444卷 215-219页

作者： Rajan S. Naik Joseph J. Lutsky Rafael Reif Charles G. Sodini Department of Materials Science and Engineering Microsystems Technology Laboratories Massachusetts Institute of Technology Cambridge USA Department of Electrical Engineering and Computer Science Microsystems Technology Laboratories Massachusetts Institute of Technology Cambridge USA

Aluminum nitride is a promising material for use in thin-film bulk acoustic wave resonators for applications in RF bandpass filters. This paper discusses the requirements needed for a dc magnetron sputtering system to grow piezoelectrically active films with x-ray diffraction rocking curves of 3.3° on silicon substrates, 5° on aluminum substrates and oxygen concentrations of l at.%. For applications in integrated resonators, a materials characterization is insufficient in predicting the subsequent device performance. A simple acoustic device structure which allows a quick measurement of the device performance is used to extract maximum effective coupling coefficients keff2 of 0.009% at 3.4GHz and 0.002% at 2.4GHz for two different films with rocking curves of 5.7° and 9.0° respectively. This parameter extraction technique may be used to make relative comparisons between films grown under different deposition conditions.

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Low Tempeature Lateral Crystallization of Amorphous Silicon on Glass

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MRS Online Proceedings Library 2011年第1期715卷 2221-2226页

作者： Leila Rezaee Aarash Akhavan Shamsoddin Mohajerzadeh Ali Khakifirooz Microsystems Technology Laboratories Massachusetts Institute of Technology Cambridge USA Thin Film Laboratory Department of Electrical and Computer Engineering University of Tehran Tehran Iran

Low temperature lateral growth of amorphous silicon films has been achieved on thin flexible glasses using ultra-violet assisted metal-induced crystallization technique. 125μm ordinary glass substrate is sputter-coated with 1500Å chromium and a 1000Å SiN layer, respectively. 1000Å Si film was deposited using e-beam evaporation at a temperature of 350°C. Equally spaced dots of nickel pads with 140μm separation were used as seed of crystallization of a-Si layer. Crystallinity of the samples was studied using XRD, SEM and optical microscopy. Some crystallographic etchants were used to develop the crystal orientations for SEM analysis. Based on this study, a lateral growth rate of 2μm/hr is obtained at a temperature of 380°C. Activation energy of 1.4 to 1.5eV is extracted for this UV-assisted MILC process.

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Spectroscopy of low-frequency noise and its temperature dependence in a superconducting qubit

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Physical Review B 2012年第17期85卷 174521-174521页

作者： Fei Yan Jonas Bylander Simon Gustavsson Fumiki Yoshihara Khalil Harrabi David G. Cory Terry P. Orlando Yasunobu Nakamura Jaw-Shen Tsai William D. Oliver Department of Nuclear Science and Engineering Massachusetts Institute of Technology (MIT) Cambridge Massachusetts 02139 USA Research Laboratory of Electronics MIT Cambridge Massachusetts 02139 USA Institute of Physical and Chemical Research (RIKEN) Wako Saitama 351-0198 Japan Institute for Quantum Computing and Department of Chemistry University of Waterloo Ontario Canada N2L 3G1 Perimeter Institute for Theoretical Physics Waterloo Ontario Canada N2J 2W9 Department of Electrical Engineering and Computer Science MIT Cambridge Massachusetts 02139 USA Green Innovation Research Laboratories NEC Corporation Tsukuba Ibaraki 305-8501 Japan MIT Lincoln Laboratory 244 Wood Street Lexington Massachusetts 02420 USA

We report a direct measurement of the low-frequency noise spectrum in a superconducting flux qubit. Our method uses the noise sensitivity of a free-induction Ramsey interference experiment, comprising free evolution in the presence of noise for a fixed period of time followed by single-shot qubit-state measurement. Repeating this procedure enables Fourier-transform noise spectroscopy with access to frequencies up to the achievable repetition rate, a regime relevant to dephasing in ensemble-averaged time-domain measurements such as Ramsey interferometry. Rotating the qubit's quantization axis allows us to measure two types of noise: effective flux noise and effective critical-current or charge noise. For both noise sources, we observe that the very same 1/f-type power laws measured at considerably higher frequencies (0.2−20 MHz) are consistent with the noise in the 0.01−100-Hz range measured here. We find no evidence of temperature dependence of the noises over 65−200 mK, and also no evidence of time-domain correlations between the two noises. These methods and results are pertinent to the dephasing of all superconducting qubits.

关键词： QUBITS PHYSICS experiments SUPERCONDUCTORS FOURIER transform infrared spectroscopy TIME-domain analysis CORRELATION (Statistics) TEMPERATURE effect

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