Fault Modeling and Fault Type Distinguishing Test Methodsfor Digital Microfluidics Chips

作     者：Sun, Xinyu 

作者单位：University of Cincinnati 

学位级别：master

导师姓名：Dr. Wenben Jone

授予年度：2013年

主      题：Computer Engineering Fault modeling Test methods BIST Digital microfluidics chip Microfluidics EDA March algorithm 

摘      要：Physical defects in digital microfludics chips (DMCs)can be very complicated and extremely difficult to find precisemodels, because each defect may occur anywhere. In this thesis, wedevelop high-level abstract fault models based on investigating thefaulty and fault-free behaviors of droplet moving. Two new faultmodels that were not found previously are proposed to enhance thereliability of DMCs. We believe that the high-level fault modelscan completely cover all defects involving two cells in a DMCarray. Based on the new high-level fault models, we propose marchalgorithms (march-d and march-p/p+) to generate test patterns thatcan detect and distinguish fault types for each faulty digitalmicrofludics chip. This is accomplished by merging both march-d andpart of march-p without causing too much test length *** algorithms are implemented into a FPGA board attached to thesimulated digital microfluidics chip such that built-in self-testcan be accomplished without human intervention. We also develop anEDA tool and simulation platform for the proposed DMC-BIST *** results demonstrate that the proposed fault models,test and fault type distinguishing methods, built-in self-testcircuit design, and emulation tool can effectively and efficientlyachieve high quality test with minimal test cost